RELIABILITY OF MICROPROCESSOR-BASED PROTECTIVE DEVICES – REVISITED
نویسندگان
چکیده
منابع مشابه
Reliability of Microprocessor–based Protective Devices –– Revisited
The article is a continuation of a set of the author’s previous publications about the reliability of the microprocessorbased protective devices. The statistical data introduced by the author coincide with data of other authors and confirm higher reliability of electromechanical relays in comparison with microprocessor-based. The inadequacy of the criterion for estimating the reliability of the...
متن کاملReliability of microprocessor-based relay protection devices - myths and reality
Malfunction of relay protection is one of the main causes of the serious failures that periodically occur in power systems all over the world. According to the North American Electric Reliability Council [1] in 74 % cases the reason for heavy failures in power systems was the incorrect actions of relay protection in trying to avoid the failure. Thus the reliability of a power system depends on ...
متن کاملReliability of Microprocessor-Based Relay Protection Devices: Myths and Reality
The article examines four basic theses about the ostensibly extremely high reliability of microprocessor-based relay protection (MP) touted by supporters of MP. Through detailed analysis based on many references it is shown that the basis of these theses are widespread myths, and actually MP reliability is lower than the reliability of electromechanical and electronic protective relays on discr...
متن کاملMicroprocessor-Based Protective Relays Applications in Nigeria Power System Protections
Electric Utilities Company of Nigeria (EUCN) have traditionally used electromechanical (EMR) distance relays for the protection of transmission lines in the past, and many such relays are still in use in power systems today. In this paper, microprocessor-based protective relays (MPBRs) applications in the Nigeria power systems protection were investigated. This paper evaluates the performance o...
متن کاملBackend dielectric reliability simulator for microprocessor system
Backend dielectric breakdown is one of the major sources of wearout for microprocessors. We present test data and a methodology to accurately estimate the lifetime for a microprocessor system due to backend dielectric breakdown. Our methodology incorporates activity in the nets surrounding each dielectric segment in the layout, temperature, and all layout spacings among parallel tracks. We anal...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Electrical Engineering and Power Engineering
سال: 2011
ISSN: 2521-6244,1607-6761
DOI: 10.15588/1607-6761-2011-2-8